TY  - BOOK
AU  - Abramovici, Miron
AU  - Breuer, Velvin A.
AU  - Friedman, Arthur D.
TI  - Digital systems testing and testable design
SN  - 8172248911
U1  - 621.3916 
PY  - 2001///
CY  - Delhi
PB  - Jaico Pub. House
KW  - Electronic Engineering; Electronic Computers
ER  -